The oxidation states of the SnO 2 thin film were confirmed by the shape analysis of corresponding XPS O 1 s, Sn 3 d, and Sn 4 d peaks using the decomposition procedure. The average crystallite size of ∼21.3 nm for SnO 2 was calculated by Rietveld method using XRD data. A mixture of SnO and SnO 2 phases was observed. Deposited film was found to be polycrystalline. A range of diagnostic techniques including X-ray diffraction (XRD), UV–visible absorption, atomic force microscopy (AFM), scanning electron microscopy (SEM), and synchrotron-based X-ray photoelectron spectroscopy (XPS) were used to investigate structural, optical, and electronic properties of the resulting film. The film was prepared from an aqueous solution of tin tetrachloride (stannic chloride) onto glass substrates at 400 ☌. Highly transparent polycrystalline thin film of SnO 2 (tin dioxide) was deposited using a simple and low cost spray pyrolysis method.
0 Comments
Leave a Reply. |